ISCAS'85 and '89 Benchmarks
ITC'02 Benchmarks

International Test Conference (ITC)
VLSI Test Symposium (VTS)
Design Automation Conference (DAC)
Design, Automation and Test in Europe (DATE)
International Conference on Computer-Aided Design (ICCAD)
International Conference on Computer Design (ICCD)
Asian Test Symposium (ATS)
Asia South Pacific DAC (ASP-DAC)
International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT)
IEEE North Atlantic Test Workshop (NATW)
IEEE Symposium on Security and Privacy
International Symposium on Field-Programmable Gate Array (FPGA)
International Workshop on Design and test of Defect-Tolerant Nanoscale Architecture
International Workshop on Defect Based Testing

IEEE Transactions on Computers
IEEE Transactions on Computer-Aided Design
IEEE Transactions on VLSI
IEEE Transactions on Dependable and Secure Computing
IEEE Design & Test of Computers
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on nanotechnology
Journal of Low Power Electronics
ACM transactions on Design Automation of Electronic Systems
Journal of Electronic Testing: Theory and Applications (JETTA)
ACM Transactions on Information and System Security
IEEE transactions on reliability

IEEEXplore
IEEE P1500 Standard for Embedded Core Test (SECT)
Test Technology Technical Council (TTTC)
Short Descriptions of Synopsys Tools