Computer-Aided Design and Test Research Group

This research group focuses on computer-aided design and test of CMOS-based and nanoscale devices. Current research includes CAD, test and defect tolerance of nanoscale devices, delay fault testing, Power supply noise estimation and pattern generation, secure design and FPGA testing.

Director:

Dr. Mohammad Tehranipoor

News:

* Our paper published in VTS 2005 received the BEST PAPER AWARD.

* Dr. Sandeep Shukla will be visiting our CMPE program and CADT research group on Feb. 23, 2006.

* Dr. Krish Chakrabarty will be visiting our CMPE program and CADT research group on Feb. 3, 2006.

* Click here to fill out the survey for VTS'06 panel (Survey)