Establishment of Trust and Integrity in Modern Supply Chains
Ujjwal Guin, University of Connecticut
11:30 Thursday, 25 February 2016, ITE325b
With the advent of globalization and resulting horizontal integration, modern supply chain becomes extremely complex and requires immediate solutions for eliminating counterfeit integrated circuits (ICs), which pose a serious threat to the safety and security of our day-to-day lives. The reliability of such ICs could be questionable as they may have many defects and might not go through as much of a rigorous test process as their authentic counterparts. An adversary can also create a backdoor to bypass the security modules in these ICs. In this research, I have systematically addressed the aforementioned issues by risk analysis and assessment of test methods, and by proposing different Design-for-Anti-Counterfeit (DfAC) measures. As a part of risk analysis, I have developed taxonomies for counterfeit IC types, counterfeit defects, and test methods. Based on these taxonomies, I have introduced novel test metrics and developed a comprehensive framework for assessing a set of test methods to maximize test coverage. In the DfAC domain, I have proposed a suite of solutions to detect counterfeit ICs without performing conventional tests. A set of lightweight negative-bias temperature instability (NBTI)-aware ring oscillators have been developed for combating die and IC recycling. In addition, I have developed a comprehensive solution for preventing intellectual property piracy and IC overproduction by assuring forward trust between all entities involved in the system-on-chip design and fabrication process.
Ujjwal Guin is a PhD candidate at the Electrical and Computer Engineering department of University of Connecticut, where he has been working with Dr. Mark M. Tehranipoor. His current research interests include Hardware Security and Trust, Supply Chain Security, Cybersecurity, and VLSI Design and Test. He has developed several on-chip structures and techniques to improve the security, trustworthiness, and reliability of integrated circuits. He has co-authored a book entitled “Counterfeit Integrated Circuits – Detection and Avoidance”. He has published several journal articles and refereed conference papers. He received Best Student Paper Award from the IEEE North Atlantic Test Workshop (NATW’2013). He is an active participant in the SAE International’s G-19A Test Laboratory Standards Development Committee. Mr. Guin received his B.E. degree from the Department of Electronics and Telecommunication Engineering of Bengal Engineering and Science University, Howrah, India in 2004 and the M.Sc. degree from the Department of Electrical and Computer Engineering of Temple University, Philadelphia, PA, USA in 2010.
Host: Chintan Patel