ITC University Booth Schedule

Tuesday, 10/08/2002

Desk 1

10:00 AM

11:00 AM

12:00 AM

1:00 PM

2:00 PM

3:00 PM

4:00 PM

5:00 PM

Case Western Reserve University

Detection and location of Single Event Upsets (SEUs)in CMOS SRAM

Balkaran Gill

Rutgers University

Demonstration of their research in IDDQ testing

Lan Rao and Prof. Michael Bushnell

Politecnico di Torino

Memory March Test Generator (MATE) and a Memory Fault Simulator (RASTA)

Alfredo Benso

MIT

Q&A with poster

Alexander Slocum

Tokyo Metropolitan University

Kazuhiko Iwasaki

Desk 2

University College Cork

Model-based testing applied to ADC and DACs

Carsten Wegener

Stanford University

Novel IDDQ Testing QSA-Quiescent Signal Aanalysis

Ernesto Staroswiecki

Univ. of Maryland

An Analytical Framework for Transient Signal Analysis

Abhishek Singh

Wednesday, 10/09/2002

Desk 1

10:00 AM

11:00 AM

12:00 AM

1:00 PM

2:00 PM

3:00 PM

4:00 PM

5:00 PM

Case Western Reserve University

Detection and location of Single Event Upsets (SEUs)in CMOS SRAM

Balkaran Gill

Rutgers University

Demonstration of their research in IDDQ testing

Lan Rao and Prof. Michael Bushnell

Politecnico di Torino

Memory March Test Generator (MATE) and a Memory Fault Simulator (RASTA)

Alfredo Benso

Univ. of Maryland

An Analytical Framework for Transient Signal Analysis

Abhishek Singh

Tokyo Metropolitan University

Kazuhiko Iwasaki

Desk 2

University College Cork

Model-based testing applied to ADC and DACs

Carsten Wegener

Stanford University

Novel IDDQ Testing QSA-Quiescent Signal Aanalysis

Ernesto Staroswiecki

MIT

Q&A with poster

Alexander Slocum

Thursday, 10/10/2002

Desk 1

10:00 AM

11:00 AM

12:00 AM

1:00 PM

2:00 PM

3:00 PM

4:00 PM

5:00 PM

Case Western Reserve University

Detection and location of Single Event Upsets (SEUs)in CMOS SRAM

Balkaran Gill

Rutgers University

Demonstration of their research in IDDQ testing

Lan Rao and Prof. Michael Bushnell

Politecnico di Torino

Memory March Test Generator (MATE) and a Memory Fault Simulator (RASTA)

Alfredo Benso

Tokyo Metropolitan University

Kazuhiko Iwasaki

Desk 2

University College Cork

Model-based testing applied to ADC and DACs

Carsten Wegener

Stanford University

Novel IDDQ Testing QSA-Quiescent Signal Aanalysis

Ernesto Staroswiecki

Univ. of Maryland

An Analytical Framework for Transient Signal Analysis

Abhishek Singh